QuickSun® 600Lab
All-in-one module testing station designed for PV laboratories
- I-V measurement and EL inspection within seconds with minimal module handling
- The most cost-effective solution for state-of-the-art inspection tools
- Class A+A+A+ solar simulator with continuous 300–1200 nm Xenon spectrum
- By far the most compact solution for I-V and EL on the market
- HJT, bifacial, frameless, custom dimensions… You can test them all
QuickSun 600Lab establishes a completely new product class for PV module laboratories – Class A+A+A+ solar simulator and high resolution EL inspection as a single table top system. The size of the system is comparable to the most compact solar simulators or EL inspection tools on the market – with the exception that QuickSun 600Lab includes them both! Just slide the module in and connect the cables, and the system provides both the I-V characteristics and EL image within seconds – ready for automatic reporting or further analysis.
Proven, future-proof solar simulator
With the A+A+A+ classification, continuous 300–1200 nm Xenon spectrum and Pmax repeatability of less than 0.1%, the measurements are highly reliable. High-efficiency PV technologies, such as HJT and TOPCon, are accurately measured with the trusted Capacitance Compensation (CAC) method which was published at the 35th EU PVSEC 2018 conference and has swiftly started to be adopted by the industry.
High-resolution EL inspection
High-quality EL images are acquired within seconds by a static camera setup. The EL image is captured after I-V measurement without any additional work required by the operator.
Optional features
The system can be equipped with capabilities for temperature coefficient, hipot, ground bond and bypass diode measurements. Further customization is available on request.
General
| Footprint, weight | 320 x 203 cm, 700 kg |
| Module dimensions | Maximum 105 x 205 cm, quickly adjustable to smaller sizes |
| Measurement time | < 5 seconds (typical, including IV measurement and EL inspection) |
| Cycle time | 10 seconds |
| Contacting | Manual contacting to module cables (other options available on request) |
| Operating temperature | 15 – 35 °C |
Solar simulator
| Pmax repeatability | Std. < 0.1 % |
| Irradiance non-uniformity | Class A+, < 1 % |
| Spectrum | Class A+, 300 – 1200 nm continuous Xenon spectrum |
| Long-term instability (LTI) | Class A+, < 1 % |
| Lamp changeover interval | 500 000 measurements (average) |
| Bifacial measurement | Single-side or both sides separately, reflections eliminated |
| High-capacitance modules | Capacitive effects eliminated with the Capacitance Compensation (CAC) method |
| Irradiance range | 200 – 1200 W/m² |
| Voltage measurement | 1 – 100 V, accuracy < 0.2% (other ranges on request) |
| Current measurement | 0.5 – 25 A, accuracy < 0.2% (other ranges on request) |
| Temperature measurement | Infrared sensor, accuracy < 1°C |
EL inspection
| Image resolution | 45 MP / 200 μm per pixel |
| Measurement time | 1 – 5 seconds (typical, depends on cell type) |
| Current range | 0 – 20 A, freely adjustable |
| Automatic defect detection | Available as an option |
Options
| Temperature coefficient measurement | From room temperature to RT + 15°C, module heating with power source |
| Hipot test | Up to 6.5 kV; 0.1 nA sensitivity |
| Ground bond test | Inductively coupled; 0.2 mΩ sensitivity |
| Bypass diode test | IEC 61215-2 functionality test |