A detailed test report is included with every simulator, proving a class A+A+A+ performance with respect to spectrum, irradiance non-uniformity, and short-term instability (STI). The Xenon technology spectrum is continuous, from 300 nm up to 1,200 nm, and it complies without any reservations with the future standard IEC 60904-9 Ed. 3. Long-term instability (LTI) is also within class A+ tolerances during the 40-ms-long flash pulse – even the high efficiency and capacitance IBC and HJT modules can be measured accurately by applying the Capacitance Compensation (CAC) method. This scientifically justified procedure enables the measurement of the steady-state I-V curve in only 40 ms, eliminating the need for longer flash pulses. The QuickSun 600 testing chamber is inherently designed to enable the single-side testing of bifacial modules at elevated intensities. The applied test procedures and reports comply fully with the standards IEC 60904-1 and IEC 60904-9.

EL images having a 200-μm pixel resolution are recorded with six 8.3-MP CCD cameras, enabling software-based automatic image analysis to identify and categorize small faults, such as micro-cracks and finger interruptions. Bypass diodes are tested according to the functionality test specified in the standard IEC 61215-2, and a high-resolution image of the cell side of the module is recorded and used to analyze such features as cell-to-cell distance, particle contamination, and ribbon misalignment.

QuickSun 600 has the capability to perform hipot and ground bond tests, as stipulated in the applicable UL and IEC standards. The actual leakage current is measured with a sensitive enough instrument that enables a run-time diagnosis of both contacting reliability and real module leakage characteristics. Ground bond is tested with proprietary sensors that eliminate the need to penetrate the frame surface oxide.