QuickSun 600
Sun simulator for PV module assembly lines
High capacity and precise PV Testing
The QuickSun 600 is a best in class A+A+A+ sun simulator for production lines. Thanks to the outstanding measurement performance, high level of automation and fast cycle time, QuickSun 600 is an ideal solution for PV module mass production.
The device is compatible with Endeas All-in-One technology. This means that besides I-V testing, the system can integrate EL imaging, bypass diode test, electrical safety tests into a single machine. Less machines translates into fewer operators, lowest total cost of ownership and higher production uptime.
- Class A+A+A+ sun simulator
- Increase productivity with All-in-One testing
- Accurate & precise results
- Cycle time <21 second with all tests
- Modules sizes up to 265 cm x 137 cm
Sun simulator
QuickSun 600 achieves A+A+A+ classification according to IEC 60904-9 Ed.3. The outstanding measurement stability provides power measurement repeatability smaller than 0.1% guaranteeing best value for the produced modules, and high quality data for product development and Industry 4.0 process control. Even the high efficiency HJT, TOPCon, and IBC modules are measured accurately with optimized length flash pulse and proprietary Capacitance Compensation (CAC) method.
EL imaging and Bypass Diode Test
Integrating high-resolution EL imaging and bypass diode test in the same QuickSun 600 housing streamlines back-end line testing process and brings level of quality assurance to the next level. Even further OPEX saving are achieved with automated EL analysis and classification software.
Electrical Safety
With optional hipot and ground continuity measurement the safety and reliability of produced PV modules is guaranteed. The actual leakage current is measured with a sensitive instrument to enable the diagnosis of both contacting reliability and real module leakage characteristics.
Key characteristics
General
| Module loading | Automated | Long-edge-leading |
| Module dimensions | Maximum 265 cm x 137 cm | |
| Cycle time | <20 seconds with all tests | <16 seconds with EL and bypass diode test |
| Automation | Module movement & contacting |
Sun simulator
| Repeatability | Standard deviation < 0.1 % | |
| IEC 90604-9 Ed.3 | Class A+A+A+ | |
| Flash tube lifetime | 750 000 measurements | |
| High eff. modules | Capacitance Compensation (CAC) method | HJT, TOPCon, IBC etc. |
| Measurement scales | 1–100 V & 0.5-25 A (other scales on request) |
Optionals
| EL Imaging | 250 µm per pixel | Deep learning analysis on request |
| Bypass diode test | Functionality test | Acc. IEC 61215-2 |
| Electrical safety tests | Hipot & Ground continuity | Real values measured |
