Module Solar Simulators
800-Series simulators are always tested, certified and results reported exactly as specified in the applicable solar simulator standards and this is being proved by a globally recognized inspection body, SGS Fimko Ltd.
In order to comply with the Class AAA tolerances of the standard IEC 60904-09, ed. 2, proprietary optics has been developed for filtering the spectrum and improving irradiance non-uniformity. Since voltage, current and irradiance signals are recorded simultaneously, Short Term Instability (STI) is inherently 0% and in A class.
800-Series simulators are routinely applied to measure standard mono/polycrystalline silicon, or a-Si, CdTe and CIS/CIGS PV modules. The measurement of thin film materials only requires filtering of the monitor cell in order to comply with the spectral response of the material to be measured.
All 800-Series simulators are equipped with two flash generators. This extends the length of the flash pulse and improves Long Term Instability (LTI). Additionally, double slope voltage sweep and 2-flash measurement allow testing of high capacitance PV materials.
|Max module size [cm x cm]||80 x 125||120 x 200||150 x 220|
|Testing capacity [meas/hr]||120||120||90|
|Flash tunnel [cm × cm × cm]||390×160×250||465×240×250||555×250×270|
|Flash pulse duration [ms]||20||15||12|
|IV data recording duration [ms]||7||6.5||6|
|Effective measurement time* [ms]||17 / 85||16 / 80||15 / 75|
|Irradiance range [W/m²]||200 - 1200||200 - 1200||200 - 1200|
|Flash tube lifetime** [flashes]||400 000||250 000||150 000|
|IEC904-9 ed. 2 compliance|
|Spectrum < ± 25%||A||A||A|
|Non-Uniformity < ±2%||A||A||A|
|Short term instability (STI) < 0.5%||A||A||A|
|Long term instability (LTI) < ±2%||A||A||A|
|Non-uniformity test positions||5 x 8||6 x 11||8 x 11|
** on average
QuickSun electronics records voltage, current and irradiance signals when voltage is swept from short circuit to open circuit. Simultaneously module temperature is measured either indirectly by ambient temperature measurement or by an IR sensor. Dark reverse IV characteristics can be recorded with an optional power source.
|Contacting||4-wire / Kelvin|
|Load element||feedback controlled MOSFET|
|Voltage sweep||Double slope sweep||Isc -> Voc, Voc -> Isc; average of both|
|Bias power source||0 - 4.5 V|
|Voltage measurement||1 - 100 V (other scales on request)||accuracy 0.2 % / 512 samples|
|Current measurement||0.5 - 25 A (other scales on request)||accuracy 0.2 % / 512 samples|
|Irradiance measurement||200 - 1200 W/m²||resolution 1 W/m² / 512 samples|
|Module temperature||0 - 75 ºC||accuracy 1 ºC|
|Monitor cell temperature||0 - 75 ºC||accuracy 1 ºC|
Every QuickSun simulator is thoroughly factory acceptance tested (FAT) before dispatching the system to the client’s site. The test results are included with the simulator documentation assisting the module manufacturers to convince their clients that modules are tested with a true Class AAA simulator.
Non-uniformity is measured by recording the short circuit current distribution of a laminated c-Si cell over specified test area. Same test can be easily reproduced at client’s site by using the test sensor and Quicksun software tools provided with the simulator.
Voltage, current and temperature measurement accuracies are calibrated and verified to comply with IEC904-1 ed. 2 specifications. Irradiance measurement accuracy is factory calibrated but final calibration is performed on-site by applying client’s certified reference modules.
QuickSun software is designed to provide flexibility for different end-users, from fully automated large scale production lines to smaller factories and research institutes. It combines a diverse range of options for control and data handling to ease in use and simplicity. Full remote control of the software is possible through a TCP interface, and measurement data is conveniently transferred to an external database using an ODBC interface.
Classification of measurements based on all key performance parameters is readily available. QuickSun also analyses curve derivatives for shunt and series resistance evaluation, measures series resistance according to IEC 60891, and has easy-to-use features for irradiance non-uniformity measurement.
|TCP||Data / Control||Total Control of QuickSun simulator with client/server TCP protocol. Measurement data in reply messages.|
|Control||Control of QuickSun simulator by digital signal. Generally used together with External Database.|
|Data export||Data||Exporting of measurement data in CSV -style.|
|External database, ODBC||Data||Sending of measurement data and characteristics to a SQL database with ODBC interface.|
|Label printing*||Data||Data exchange and printing control of Codesoft label design software.|
800-Series simulators can be installed either horizontally or vertically and instructions for constructing a corresponding flash tunnel or tower are supplied with the simulators.
Flash tunnel gives easier access to the flash head e.g. for changing the flash tube but takes more factory space. A test surface with fixed test sensor positions covering the nominal test area of each simulator is an essential part in order to perform fluent and reproducible irradiance nonuniformity measurements.
EL imaging option is available with two integrated 8.3 Mpixel CCD cameras. This results in about 500 μm pixel resolution and enables visual detection of faults like micro cracks. Typical exposure time is 5–20 seconds and 850 W power source provides up to 14 A to 72 cells c-Si modules.
Also instrumentation for Electrical Safety Testing option is available including manual frame contacting. True leakage current and insulation resistance are evaluated simultaneously with nA scale measurement sensitivity which confirms also reliable frame contacting.