Versatile quality control testing system
- Class A+A+A+ solar simulator with 105 x 205 cm test area
- EL imaging and analysis with 200 μm resolution
- True leakage current measurements with nA scale sensitivity
QuickSun 550Ei is a versatile testing system for qualifying of PV modules with dimensions up to 105 x 205 cm2. Basic set up includes a top class solar simulator which measures modules in sunny side up position enabling e.g. soiling simulations. Several additional measurement methods can be integrated to the same system including high resolution EL imaging with analysis software from one of the most recognized EL system suppliers. Also hot spot revealing IR images can be recorded by applying either forward or reverse bias current, and true nA scale leakage current measurements can be performed with sensitive enough instruments.
A detailed test report is included with every simulator proving Class A+A+A+ performance with respect to spectrum, irradiance non-uniformity and short term instability (STI). Long term instability (LTI) is also within Class A+ tolerances during the 40 ms long flash pulse. A feedback controlled electronic load and sampling unit measures voltage, current and irradiance signals when module is swept e.g. from short circuit to open circuit. Both forward and/or backward voltage sweeps including their slope rate can be adjusted freely and also a combined IV graph is calculated automatically. This enables accurate measurement of very high capacitance and top efficiency c-Si modules. Applied test procedures and reports comply fully with the standards IEC 60904-1 and IEC 60904-9 as inspected and proved by SGS Fimko Ltd.
EL-images having 200 μm pixel resolution are recorded with six 8.3 Mpixel NIR ccd cameras. This enables sofware based automatic image analysis in order to identify and categorize small faults like microcracks and finger interruptions. If automatic analysis is not required cost effective 500 μm resolution EL picture can be recorded with two corresponding ccd cameras. A 850 W power supply can provide upto 14 A even to 72 cell modules. Typical exposure times vary between 5–20 seconds depending on the desired image quality.
QuickSun 550Ei has the capability to perform insulation resistance, dielectric withstand and ground continuity tests as stipulated in the applicable UL and IEC standards.
Actual leakage current of PV modules is a few hundred nano amperes with a typical 4 KV test voltage while the widely applied dielectric withstand test acceptance criteria is 50 μA. QuickSun 550Ei surpasses this minimum requirement and measures true insulation resistance and leakage currents accurately with sensitive enough instruments. This enables run time diagnosis of both contacting reliability and real module leakage characteristics.
|Contacting||J-Box / contact adapter; 4-wire / Kelvin||Frame; probes to drainage holes|
|Load||feedback controlled MOSFET||adjustable bias 0 – 4.5 V|
|Voltage sweep||linear and double slope alternatives||Isc -> Voc, Voc -> Isc; average of both|
|Voltage measurement||1 – 100 V (other scales on request)||accuracy 0.2 % / 512 samples|
|Current measurement||0.5 – 25 A (other scales on request)||accuracy 0.2 % / 512 samples|
|Irradiance control||100 – 1100 W/m²||resolution 1 W/m² / 512 samples|
|Module temperature (IR)||RT – 75 ºC||accuracy 1 ºC|
|Monitor cell temperature||RT – 75 ºC||accuracy 1 ºC|
|Pmp repeatability||< 0.1% (1σ/ave)|
|Average flash tube life time||300 000 flashes|
|Operation temperature||15 – 35 ºC|
|Mains utilities||3~, 400 Vac, 3 x 16 A, 50-60 Hz||CDA 4 – 6 bar|
|Dimensions, weight||310 x 180 x 250 cm||850 – 1100 kg, depending on options|